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About the research migration
  • Proposer Name: Mr Anik Jain
  • Title of the research migration: eSim Migration of an X-ray Detector Charge-Sensitive Preamplifier for Noise Reduction
  • Source of the Project: Dimković, A., "Simulation and Machine Learning-Assisted Optimization of X-ray Detector Circuit for Noise Reduction", University of Nis, Faculty of Electronic Engineering, Serbia.
  • University: National Institute of Technology Delhi
  • Name of the faculty: Dr. Rikmantra Basu